Journal de Physique III

Vol. 4 No. 9 (September 1994)

• Characterization of thin films and multilayers by specular X-ray reflectivity     p. 1503
  W. M. Plotz and K. Lischka
  Abstract | PDF file (387 KB) | References



• Curvature effect in grazing X-ray reflectometry     p. 1513
  F. Bridou
  Abstract | PDF file (441 KB) | References



• Use of Fourier transfoim in grazing X-rays reflectometry     p. 1523
  F. Bridou and B. Pardo
  Abstract | PDF file (311 KB) | References



• Thin layer diffraction     p. 1533
  Paul F. Fewster
  Abstract | PDF file (534 KB) | References



• X-ray diffuse scattering as a probe for thin film and interface structure     p. 1543
  S. K. Sinha
  Abstract | PDF file (685 KB) | References



• Influence of roughness profile on reflectivity and angle-dependent X-ray fluorescence     p. 1559
  D.K.G. de Boer, A.J.G. Leenaers and W.W. van den Hoogenhof
  Abstract | PDF file (327 KB) | References



• X-ray characterization of semiconductor surfaces and interfaces     p. 1565
  W. Plotz, V. Holy, W. V. D. Hoogenhof and K. Lischka
  Abstract | PDF file (346 KB) | References



• Diffuse X-ray scattering of amorphous multilayers     p. 1573
  T. Salditt, T. H. Metzger, J. Peisl and X. Jiang
  Abstract | PDF file (436 KB) | References



• X-ray waveguide structures of thin metal-carbon layers     p. 1581
  S. I. Zheludeva, M. V. Kovalchuk, N. N. Novikova, A. N. Sosphenov, N. E. Malysheva, N. N. Salashenko, A. D. Akhsakhalyan and Yu. Yu. Platonov
  Abstract | PDF file (349 KB) | References



• Design and manufacture of sputtered multilayers for applications to soft X-ray optics     p. 1589
  Ph. Houdy and P. Boher
  Abstract | PDF file (480 KB) | References



• Some applications of nanometer scale structures for current and future X-ray space research     p. 1599
  F. E. Christensen, S. Abdali, P. K. Frederiksen, A. Hornstrup, I. Rasmussen, N. J. Westergaard, H. W. Schnopper, E. Louis, H.-J. Voorma, N. Koster, H. Wiebicke, I. Halm, U. Geppert, E. Silver, M. Legros, K. Borozdin, K. D. Joensen, P. Gorenstein, J. Wood and G. Gutman
  Abstract | PDF file (783 KB) | References



• Soft X-ray spectroscopy     p. 1613
  D. S. Urch
  Abstract | PDF file (643 KB) | References



• X-ray gratings and projection lithography by means of laterally structured multilayers     p. 1625
  U. Heinzmann
  Abstract | PDF file (982 KB) | References



• High resolution X-ray diffraction of one- and two-dimensional periodic surface gratings     p. 1639
  P. van der Sluis
  Abstract | PDF file (436 KB) | References



• Multilayer diffraction grating properties     p. 1649
  A. Erko, V. Martynov, D. Roshchoupkin, A. Yuakshin, B. Vidal, P. Vincent and M. Brunel
  Abstract | PDF file (468 KB) | References



• Recent advances in etched multilayer X-ray optics     p. 1659
  J. M. André, A. Sammar, S. Bac, M. Ouahabi, M. Idir, G. Soullié and R. Barchewitz
  Abstract | PDF file (368 KB) | References



• Laser plasma sources for soft X-ray projection lithography     p. 1669
  F. Bijkerk, L. Shmaenok, A. van Honk, R. Bastiaensen, Yu. Ya. Platonov, A. P. Shevelko, A. V. Mitrofanov, F. Voß, R. Désor, H. Frowein and B. Nikolaus
  Abstract | PDF file (525 KB) | References



• The HELIOS series of advanced, synchrotron based, X-ray sources     p. 1679
  V. C. Kempson, A. R. Jorden, N. C. E. Crosland, M. N. Wilson, J. C. Schouten, M. C. Townsend and R. J. Anderson
  Abstract | PDF file (429 KB) | References



• Effets de compétition entre les phénomènes de dopage et d'endommagement dans les polymères électroactifs implantés     p. 1689
  A. Moliton, C. Moreau, B. Lucas, R. H. Friend and G. Froyer
  Abstract | PDF file (1.10 MB) | References



• Etude par pompage de, charge des défauts induits à l'interface Si-SiO par rayonnements ionisants     p. 1707
  Jean-Luc Autran, Bernard Balland, Jean-Pierre Vallard and Daniel Babot
  Abstract | PDF file (982 KB) | References



• Simulation du comportement thermique en régime permanent d'un moteur asynchrone à refroidissement extérieur. Etude par éléments finis     p. 1723
  R. Glises, G. Hostache and J.M. Kauffmann
  Abstract | PDF file (562 KB) | References



• Contribution de la mesure de température par micro-sonde thermoélectrique a la microscopie thermique     p. 1737
  L. Thiery, J. P. Prenel and R. Porcar
  Abstract | PDF file (833 KB) | References



• Evaluation of real-space images of Pt-single crystals produced by backscattered electrons in the kiloelectronvolt range     p. 1751
  Markus Lambrigger
  Abstract | PDF file (975 KB) | References



• Test of a recoil ion source at GANIL medium energy facility     p. 1765
  A. Gosselin, P. Boduch, D. Hennecart, S. Hicham, X. Husson, D. Lecler, A. Lepoutre, A. Cassimi and J. P. Grandin
  Abstract | PDF file (676 KB) | References