Journal de Physique III

Vol. 7 No. 12 (December 1997)

• Trapping and Recombination Properties Due to Trap Clustering     p. 2275
  A. Mandowski and J. Swiatek
  Abstract | PDF file (338 KB) | References



• Dislocation and Grain Boundary Energies in Si and Ge from an Anharmonic Bond Charge Model     p. 2281
  H. Teichler and J. Wilder
  Abstract | PDF file (803 KB) | References



• Dislocation-Point Defect Interaction Effect on Local Electrical Properties of Semiconductors     p. 2293
  E.B. Yakimov
  Abstract | PDF file (101 KB) | References



• Heteroepitaxy of Cubic GaN     p. 2309
  A. Trampert, O. Brandt, H. Yang and K.H. Ploog
  Abstract | PDF file (840 KB) | References



• Microstructure of Pyramidal Defects in InSb Layers Grown by Atomic Layer Molecular Beam Epitaxy on InP Substrates     p. 2317
  J.C. Ferrer, F. Peiró, A. Cornet, J.R. Morante, T. Utzmeier and F. Briones
  Abstract | PDF file (861 KB) | References



• TEM Imaging of Dislocation Kinks, their Motion and Pinning     p. 2325
  J.C.H. Spence, H.R. Kolar and H. Alexander
  Abstract | PDF file (1.20 MB) | References



• Analysis of Large Impurity Atmospheres at Dislocations and Associated Point Defect Reactions in Differently n-Doped GaAs Crystals     p. 2339
  C. Frigeri, J.L. Weyher, J. Jiménez and P. Martín
  Abstract | PDF file (1.80 MB) | References



• Thermal Behaviour of Deep Levels at Dislocations in n-Type Silicon     p. 2361
  D. Cavalcoli, A. Cavallini and E. Gombia
  Abstract | PDF file (306 KB) | References



• Mechanical Strength and Dislocation Velocities in GeSi Alloys     p. 2367
  Ichiro Yonenaga and Koji Sumino
  Abstract | PDF file (488 KB) | References



• Strain Measurements in Thin Film Structures by Convergent Beam Electron Diffraction     p. 2375
  A. Armigliato, R. Balboni, A. Benedetti, S. Frabboni, A. Tixier and J. Vanhellemont
  Abstract | PDF file (426 KB) | References



• Influence de l'introduction de défauts colonnaires amorphes sur les propriétés de transport d'un monocristal supraconducteur à haute     p. 2385
  Franck Warmont, Sylvie Hébert, Vincent Hardy, Christine Martin, Charles Simon and Jackie Provost
  Abstract | PDF file (485 KB) | References



• Microstructures and Mechanical Properties of NiAl-(Cr) and TiAl-(Cr) Intermetallic Alloys     p. 2393
  G. Frommeyer and C. Derder
  Abstract | PDF file (751 KB) | References



• Étude théorique de matériaux bianisotropes synthétiques contrôlables     p. 2405
  Fabrice Auzanneau and Richard W. Ziolkowski
  Abstract | PDF file (567 KB) | References



• Méthodes de type éléments finis pour le calcul des champs électriques et magnétiques en électroencéphalographie et magnétoencéphalographie     p. 2419
  Christophe Guérin, Gildas Marin, Line Garnero and Gérard Meunier
  Abstract | PDF file (798 KB) | References



• Filtrage actif des harmoniques en courant et en tension des reseaux électriques : modélisation, simulation numérique et expérimentation     p. 2433
  C. Lott, O. Lapierre, H. Pouliquen and S. Saadate
  Abstract | PDF file (1.01 MB) | References



• Optical Characterization of the Director Field in a Distorted Nematic Layer     p. 2459
  Emmanuel Plaut, Alain Joets and Roland Ribotta
  Abstract | PDF file (953 KB) | References


Erratum

• Measurement of Atomic Fractions in Multi-Phased Materials of Limited Mass via an Empirical Approach to EXAFS Modeling     p. 2475
  V.G. Harris, S.A. Oliver, J.D. Ayers and B.N. Das
  Abstract | PDF file (252 KB) | References