A simple system to measure internal friction and creep

(Received 5 November 1991, revised 21 April 1992, accepted 23 April 1992)

Abstract
A system is described to measure internal friction and creep of thin materials. The detection is based on the variation in collector current with the capacitance of the tuned circuit of a tuned collector crystal oscillator. The mechanical systems used to realize those measurements are described. A high sensitivity is obtained for the different modes of solicitation.