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Revue J. Phys. III France Volume 7, Numéro 12, December 1997 Page(s) 2475 - 2478 DOI 10.1051/jp3:1997270

DOI: 10.1051/jp3:1997270
J. Phys. III France 7 (1997) 2475-2478

Erratum

Measurement of Atomic Fractions in Multi-Phased Materials of Limited Mass via an Empirical Approach to EXAFS Modeling

V.G. Harris¹, S.A. Oliver², J.D. Ayers¹ and B.N. Das<sup>1

1</sup>  U.S. Naval Research Laboratory, Washington, D.C. 20375, U.S.A.
²  Center for Electromagnetics Research, Northeastern University, Boston, MA 02115, U.S.A.

Erratum of J. Phys. III France  7 p. C3-1153

Abstract
A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe ₈₀B ₂₀ thin films ( t = 15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitative treatment of crystalllization and precipitation kinetics in thin films and multilayered structures.

© Les Editions de Physique 1997

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