| Numéro |
J. Phys. III France
Volume 4, Numéro 9, September 1994
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|
|---|---|---|
| Page(s) | 1581 - 1587 | |
| DOI | https://doi.org/10.1051/jp3:1994225 | |
DOI: 10.1051/jp3:1994225
J. Phys. III France 4 (1994) 1581-1587
1 Institute of Crystallography, Russian Academy of Sciences, Leninsky pr. 59, Moscow 117333, Russia
2 Institute of Applied Physics, Russian Academy of Sciences, Ulyanov Str. 46, N. Novgorod 603600, Russia
© Les Editions de Physique 1994
J. Phys. III France 4 (1994) 1581-1587
X-ray waveguide structures of thin metal-carbon layers
S. I. Zheludeva1, M. V. Kovalchuk1, N. N. Novikova1, A. N. Sosphenov1, N. E. Malysheva1, N. N. Salashenko2, A. D. Akhsakhalyan2 and Yu. Yu. Platonov21 Institute of Crystallography, Russian Academy of Sciences, Leninsky pr. 59, Moscow 117333, Russia
2 Institute of Applied Physics, Russian Academy of Sciences, Ulyanov Str. 46, N. Novgorod 603600, Russia
(Received 19 November 1993, accepted 16 March 1994)
Abstract
X-ray waveguide structures consisting of two ultra-thin metal layers with a carbon layer in between them deposited on glass
substrate are investigated. The reflectivity as well as fluorescence yield from the different metal layers, are used to elucidate
the role of the various layers comprising the structure.
The detailed
E-field intensity distribution inside and above the layers is presented.
© Les Editions de Physique 1994