| Numéro |
J. Phys. III France
Volume 4, Numéro 9, September 1994
|
|
|---|---|---|
| Page(s) | 1613 - 1623 | |
| DOI | https://doi.org/10.1051/jp3:1994228 | |
J. Phys. III France 4 (1994) 1613-1623
Soft X-ray spectroscopy
D. S. UrchChemistry Department, Queen Mary and Westfield College, University of London, Mile End Road, London El 4NS, Great-Britain
(Received 19 November 1993, revised and accepted 12 April 1994)
Abstract
X-ray spectrometry at low energies (
eV), long wavelengths (
>12 Å) presents special problems due to the inefficiency with which such X-rays are generated, the ease with which they are absorbed,
and the difficulty of finding suitable dispersing elements. Advantage can, however, be taken of the ready absorption of these
"soft" X-rays since their escape depth from most materials rarely exceeds one micron. Soft X-ray spectroscopy is therefore
nanometer spectroscopy. Furthermore soft X-rays show large "chemical effects" which can be used to infer the chemical state
of the emitting atom. The special problems associated with the production and dispersion of soft X-rays are considered in
this paper together with methods for calculating the depth of X-ray production from surface layers. Examples are also given
of the changes in peak shape, position and profile which can be used to assess the valency and ligand environment of the emitting
atom.
© Les Editions de Physique 1994