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Article cité :
F. Bridou
J. Phys. III France, 4 9 (1994) 1513-1522
Citations de cet article :
9 articles
Quick X-ray reflectivity of spherical samples
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Aberration effects in quick X-Ray reflectivity of curved samples
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Mass density determination of thin organosilicon films by X-ray reflectometry
A. van der Lee, S. Roualdes, R. Berjoan and J. Durand Applied Surface Science 173 (1-2) 115 (2001) https://doi.org/10.1016/S0169-4332(00)00890-4
Handbook of Surfaces and Interfaces of Materials
C. Christides Handbook of Surfaces and Interfaces of Materials 65 (2001) https://doi.org/10.1016/B978-012513910-6/50048-7
The effect of microstructure on the temperature dependence of the interlayer coupling in Co/Cu multilayers
C. Christides Journal of Applied Physics 88 (6) 3552 (2000) https://doi.org/10.1063/1.1289227
In situx-ray reflectivity study of the oxidation kinetics of liquid gallium and the liquid alloy
Anton Plech, Uwe Klemradt, Hartmut Metzger and Johann Peisl Journal of Physics: Condensed Matter 10 (5) 971 (1998) https://doi.org/10.1088/0953-8984/10/5/007
Structural, magnetotransport, and optical properties of sputtered Co/Cu multilayers examined as a function of Co layer thickness at the second antiferromagnetic maximum
C. Christides, S. Logothetidis, M. Gioti, et al. Journal of Applied Physics 83 (12) 7757 (1998) https://doi.org/10.1063/1.367950
Optical characterization of layers for silicon microelectronics
A. Chabli Microelectronic Engineering 40 (3-4) 263 (1998) https://doi.org/10.1016/S0167-9317(98)00276-7
Glancing‐incidence x‐ray analysis of thin‐layered materials: A review
D. K. G. de Boer, A. J. G. Leenaers and W. W. van den Hoogenhof X-Ray Spectrometry 24 (3) 91 (1995) https://doi.org/10.1002/xrs.1300240304