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Electronically enhanced kink motion on 30° partial dislocations in Ge directly observed by plan-view high resolution electron microscopy
Masafumi Inoue, Kunio Suzuki, Hirotaka Amasuga, Yutaka Mera and Koji Maeda Journal of Applied Physics 83(4) 1953 (1998) https://doi.org/10.1063/1.366920
Reliable image processing that can extract an atomically-resolved line shape of partial dislocations in semiconductors from plan-view high-resolution electron microscopic images