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Cited article:

Atomic structures and dynamic properties of dislocations in semiconductors: current progress and stagnation

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Semiconductor Science and Technology 35 (4) 043001 (2020)
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Nanoscale mechanisms of misfit dislocation propagation in undulated Si1−xGex/Si(100) epitaxial thin films

Chi-Chin Wu, Eric A Stach and Robert Hull
Nanotechnology 18 (16) 165705 (2007)
https://doi.org/10.1088/0957-4484/18/16/165705

Kinetic Monte Carlo and density functional study of hydrogen enhanced dislocation glide in silicon

S. Scarle and C. P. Ewels
The European Physical Journal B 51 (2) 195 (2006)
https://doi.org/10.1140/epjb/e2006-00215-9

Dynamics of kinks on dislocations in SiGe single crystals

Yu. L. Iunin, V. I. Nikitenko, V. I. Orlov, et al.
Journal of Experimental and Theoretical Physics 94 (1) 108 (2002)
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Enhancement of dislocation velocities by stress-assisted kink nucleation at the native oxide/SiGe interface

E. A. Stach and R. Hull
Applied Physics Letters 79 (3) 335 (2001)
https://doi.org/10.1063/1.1384904

Electronically enhanced kink motion on 30° partial dislocations in Ge directly observed by plan-view high resolution electron microscopy

Masafumi Inoue, Kunio Suzuki, Hirotaka Amasuga, Yutaka Mera and Koji Maeda
Journal of Applied Physics 83 (4) 1953 (1998)
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Reliable image processing that can extract an atomically-resolved line shape of partial dislocations in semiconductors from plan-view high-resolution electron microscopic images

M. Inoue, K. Suzuki, H. Amasuga, et al.
Ultramicroscopy 75 (1) 5 (1998)
https://doi.org/10.1016/S0304-3991(98)00045-X