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Cited article:

Differentiating Electron Diffuse Scattering via 4D-STEM Spatial Fluctuation and Correlation Analysis in Complex FCC Alloys

Po-Cheng Kung, Rui Feng, Peter Liaw, Jian-Min Zuo and Jessica Krogstad
Ultramicroscopy 114228 (2025)
https://doi.org/10.1016/j.ultramic.2025.114228

Oxygen precipitation in nitrogen doped Czochralski silicon wafers. I. Formation mechanisms of near-surface and bulk defects

A. Karoui, F. Sahtout Karoui, G. A. Rozgonyi and D. Yang
Journal of Applied Physics 96 (6) 3255 (2004)
https://doi.org/10.1063/1.1773921