Characterization of Ga1-xInxSb thin layers grown on GaAs substrate by infrared reflectivity A. Mezerreg, C. Llinares, N. Rezzoug et B. MbowJ. Phys. III France, 3 9 (1993) 1819-1824DOI: https://doi.org/10.1051/jp3:1993241
