Discrimination between volume and interface traps in $C (V)$ and photo $I(V)$ experiments on 10-30 nm MOS capacitorsJ. Peisner, Y. Sangare et G. LévêqueJ. Phys. III France, 3 11 (1993) 2101-2112DOI: https://doi.org/10.1051/jp3:1993263
