Charge generation in metal-oxide-semiconductor capacitors during Fowler-Nordheim stressS. Elrharbi, M. Jourdain, A. Meinertzhagen, A. El-Hdiy et C. PetitJ. Phys. III France, 4 6 (1994) 1045-1051DOI: https://doi.org/10.1051/jp3:1994185
