In-Situ Survey System of Resistive and Thermoelectric Properties of Either Pure or Mixed Materials in Thin Films Evaporated Under Ultra High VacuumL. Lechevallier, J.-Y. Le Huerou, G. Richon, J.-M. Sarrau et J. GouaultJ. Phys. III France, 5 4 (1995) 409-418DOI: https://doi.org/10.1051/jp3:1995136
