Post-Diffusion Gettering Effects Induced in Polycrystalline SiliconM. Loghmarti, K. Mahfoud, L. Ventura, J.C. Muller, D. Sayah et P. SiffertJ. Phys. III France, 5 9 (1995) 1365-1370DOI: https://doi.org/10.1051/jp3:1995196
