Radiation Effects in Thin-Film Ferroelectric PZT for Non-Volatile Memory Applications in MicroelectronicsJean-Luc Leray, Olivier Musseau, Philippe Paillet, Jean-Luc Autran, Frédéric Sodi et Yves-Marie CoïcJ. Phys. III France, 7 6 (1997) 1227-1243DOI: https://doi.org/10.1051/jp3:1997185
