Strain Measurements in Thin Film Structures by Convergent Beam Electron DiffractionA. Armigliato, R. Balboni, A. Benedetti, S. Frabboni, A. Tixier et J. VanhellemontJ. Phys. III France, 7 12 (1997) 2375-2381DOI: https://doi.org/10.1051/jp3:1997265
