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Cited article:

On quantitative mapping of EL2 concentration in semi-insulating GaAs wafers

U. V. Desnica, B. G. Petrović, M. Skowronski, M. C. Cretella

J. Phys. III France, 1 9 (1991) 1481-1487

DOI: https://doi.org/10.1051/jp3:1991205

This article has been cited by the following article(s):

The impact of deep levels on the photocurrent transients in semi-insulating GaAs

M. Pavlović, B. Šantić, D. I. Desnica-Franković, et al.
Journal of Electronic Materials 32 (10) 1100 (2003)
https://doi.org/10.1007/s11664-003-0094-2

Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization

Andreas Mandelis, Arief Budiman and Miguel Vargas
Semiconductors and Semimetals, Effect of Disorder and Defects in Ion-Implanted Semiconductors: Optical and Photothermal Characterization 46 179 (1997)
https://doi.org/10.1016/S0080-8784(08)60109-X