Articles citing this article

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Cited article:

Caractérisation électrique non destructive de couches semiconductrices par mesures d'effet Hall en hyperfréquences

P. Tabourier, C. Druon, J. M. Wacrenier

J. Phys. III France, 2 5 (1992) 805-819

DOI: https://doi.org/10.1051/jp3:1992160

This article has been cited by the following article(s):

Nondestructive mapping of GaAs wafers from measurement of magnetoresistance effect using a novel microwave device

N. Belbounaguia, C. Druon, P. Tabourier and J.M. Wacrenier
IEEE Transactions on Instrumentation and Measurement 43 (1) 24 (1994)
https://doi.org/10.1109/19.286350

Microwave device for non-destructive magnetoresistance measurement of semiconducting layers

C. Druon, N. Belbounaguia, P. Tabourier and J.M. Wacrenier
Materials Science and Engineering: B 20 (1-2) 203 (1993)
https://doi.org/10.1016/0921-5107(93)90428-P