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Cited article:
K. F. Badawi , C. Kahloun , J. Grilhé
J. Phys. III France, 3 6 (1993) 1183-1188
This article has been cited by the following article(s):
13 articles
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Profile analysis of thin film X-ray diffraction peaks
L. Bimbault, K.F. Badawi, Ph. Goudeau, V. Branger and N. Durand Thin Solid Films 275 (1-2) 40 (1996) https://doi.org/10.1016/0040-6090(95)07015-X
Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation
N. Durand, K. F. Badawi and Ph. Goudeau Journal of Applied Physics 80 (9) 5021 (1996) https://doi.org/10.1063/1.363547
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Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction
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Rotational dynamics of water molecules in a water–short-chain-nonionic-amphiphile mixture: Depolarized light scattering
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X‐ray study of elastic and plastic strains in Na+‐implanted (001) monocrystalline MgO
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