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Cited article:

Picosecond investigation of photorefractive and free carrier gratings in GaAs: EL2 and CdTe: V

Philippe Delaye, Kestutis Jarasiunas, Jean-Claude Launay, Gérald Roosen

J. Phys. III France, 3 7 (1993) 1291-1303

DOI: https://doi.org/10.1051/jp3:1993199

This article has been cited by the following article(s):

Characterization of a deep-level compensation ratio through picosecond four-wave mixing on a transient reflection grating

A Kadys, Ph Delaye, G Roosen and K Jarasiunas
Semiconductor Science and Technology 22 (9) 1044 (2007)
https://doi.org/10.1088/0268-1242/22/9/012

Investigation of defect levels in semi-insulating materials by modulated and transient photocurrent: comparison of methods

C Longeaud, J P Kleider, P Kaminski, et al.
Semiconductor Science and Technology 14 (9) 747 (1999)
https://doi.org/10.1088/0268-1242/14/9/302

Role of the charge state of deep vanadium impurities and associations of defects in photoelectric and optical properties of semi-insulating CdTe crystals

K Jarasiunas, L Bastiene, J C Launay, P Delaye and G Roosen
Semiconductor Science and Technology 14 (1) 48 (1999)
https://doi.org/10.1088/0268-1242/14/1/006

Detection of ultrasonic motion of a scattering surface by photorefractive InP:Fe under an applied dc field

Philippe Delaye, Alain Blouin, Denis Drolet, et al.
Journal of the Optical Society of America B 14 (7) 1723 (1997)
https://doi.org/10.1364/JOSAB.14.001723