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Cited article:

Assessment of deep levels in photorefractive materials by transient photoelectric methods

J. P. Zielinger, M. Tapiero

J. Phys. III France, 3 7 (1993) 1327-1344

DOI: https://doi.org/10.1051/jp3:1993202

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Real defect concentration measurements of nuclear detector materials by the combination of PICTS and SCLC methods

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