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Cited article:

EBIC/PL investigations of dislocation network produced by silicon wafer direct bonding

G. Jia, W. Seifert, T. Mchedlidze, et al.
Superlattices and Microstructures 45 (4-5) 314 (2009)
https://doi.org/10.1016/j.spmi.2008.12.012

Electrical characterization of GaN p-n junctions with and without threading dislocations

P. Kozodoy, J. P. Ibbetson, H. Marchand, et al.
Applied Physics Letters 73 (7) 975 (1998)
https://doi.org/10.1063/1.122057