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Cited article:
N. Durand , K. F. Badawi , P. Goudeau , A. Naudon
J. Phys. III France, 4 1 (1994) 25-34
This article has been cited by the following article(s):
5 articles
Small Scale Structures
N. Durand, K.F. Badawi and Ph. Goudeau Small Scale Structures 168 (1996) https://doi.org/10.1016/B978-0-444-82312-0.50092-X
Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction
N. Durand, K.F. Badawi and Ph. Goudeau Thin Solid Films 275 (1-2) 168 (1996) https://doi.org/10.1016/0040-6090(96)80096-4
Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation
N. Durand, K. F. Badawi and Ph. Goudeau Journal of Applied Physics 80 (9) 5021 (1996) https://doi.org/10.1063/1.363547
Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses
D. Rats, L. Bimbault, L. Vandenbulcke, R. Herbin and K. F. Badawi Journal of Applied Physics 78 (8) 4994 (1995) https://doi.org/10.1063/1.359725
Relaxation of residual stresses in highly stressed multilayers initiated by ion irradiation
L. Pranevicˇius, K-F. Badawi, N. Durand, J. Delafond and Ph. Goudeau Surface and Coatings Technology 71 (3) 254 (1995) https://doi.org/10.1016/0257-8972(94)02321-G