Articles citing this article

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Cited article:

Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction

N. Durand, K.F. Badawi and Ph. Goudeau
Thin Solid Films 275 (1-2) 168 (1996)
https://doi.org/10.1016/0040-6090(96)80096-4

Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation

N. Durand, K. F. Badawi and Ph. Goudeau
Journal of Applied Physics 80 (9) 5021 (1996)
https://doi.org/10.1063/1.363547

Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses

D. Rats, L. Bimbault, L. Vandenbulcke, R. Herbin and K. F. Badawi
Journal of Applied Physics 78 (8) 4994 (1995)
https://doi.org/10.1063/1.359725

Relaxation of residual stresses in highly stressed multilayers initiated by ion irradiation

L. Pranevicˇius, K-F. Badawi, N. Durand, J. Delafond and Ph. Goudeau
Surface and Coatings Technology 71 (3) 254 (1995)
https://doi.org/10.1016/0257-8972(94)02321-G