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Cited article:
N. Durand , L. Bimbault , K. F. Badawi , Ph. Goudeau
J. Phys. III France, 4 6 (1994) 1025-1032
This article has been cited by the following article(s):
12 articles
Phase transformation of the A15 metastable phase of Fe-Cr thin films prepared by ion-beam sputtering
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R. Radoi, M. Danila, P. Fernandez and J. Piqueras 2 505 (2004) https://doi.org/10.1109/SMICND.2004.1403061
Characterization and modeling of electrical resistivity of sputtered tungsten films
J. Ligot, S. Benayoun and J. J. Hantzpergue Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (3) 798 (2001) https://doi.org/10.1116/1.1355759
Microstructural study of boron doped diamond films by X-ray diffraction profiles analysis
F Brunet, P Germi and M Pernet Thin Solid Films 322 (1-2) 143 (1998) https://doi.org/10.1016/S0040-6090(97)00925-5
Stress and microstructure in YBaCuO thin films on MgO and SrTiO3 substrates studied by X-ray diffraction and bending tests
S. Auzary, F. Badawi, L. Bimbault, J. Rabier and R.J. Gaboriaud Journal of Alloys and Compounds 251 (1-2) 37 (1997) https://doi.org/10.1016/S0925-8388(96)02767-3
Study of the mechanical and microstructural state of platinum thin films
V. Branger, V. Pelosin, K.F. Badawi and Ph. Goudeau Thin Solid Films 275 (1-2) 22 (1996) https://doi.org/10.1016/0040-6090(95)07011-7
Profile analysis of thin film X-ray diffraction peaks
L. Bimbault, K.F. Badawi, Ph. Goudeau, V. Branger and N. Durand Thin Solid Films 275 (1-2) 40 (1996) https://doi.org/10.1016/0040-6090(95)07015-X
Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation
N. Durand, K. F. Badawi and Ph. Goudeau Journal of Applied Physics 80 (9) 5021 (1996) https://doi.org/10.1063/1.363547
Small Scale Structures
N. Durand, K.F. Badawi and Ph. Goudeau Small Scale Structures 168 (1996) https://doi.org/10.1016/B978-0-444-82312-0.50092-X
Small Scale Structures
L. Bimbault, K.F. Badawi, PH. Goudeau, V. Branger and N. Durand Small Scale Structures 40 (1996) https://doi.org/10.1016/B978-0-444-82312-0.50061-X
Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction
N. Durand, K.F. Badawi and Ph. Goudeau Thin Solid Films 275 (1-2) 168 (1996) https://doi.org/10.1016/0040-6090(96)80096-4
Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses
D. Rats, L. Bimbault, L. Vandenbulcke, R. Herbin and K. F. Badawi Journal of Applied Physics 78 (8) 4994 (1995) https://doi.org/10.1063/1.359725