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Cited article:
F. Bridou
J. Phys. III France, 4 9 (1994) 1513-1522
This article has been cited by the following article(s):
9 articles
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Handbook of Surfaces and Interfaces of Materials
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In situx-ray reflectivity study of the oxidation kinetics of liquid gallium and the liquid alloy
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Structural, magnetotransport, and optical properties of sputtered Co/Cu multilayers examined as a function of Co layer thickness at the second antiferromagnetic maximum
C. Christides, S. Logothetidis, M. Gioti, et al. Journal of Applied Physics 83 (12) 7757 (1998) https://doi.org/10.1063/1.367950
Optical characterization of layers for silicon microelectronics
A. Chabli Microelectronic Engineering 40 (3-4) 263 (1998) https://doi.org/10.1016/S0167-9317(98)00276-7
Glancing‐incidence x‐ray analysis of thin‐layered materials: A review
D. K. G. de Boer, A. J. G. Leenaers and W. W. van den Hoogenhof X-Ray Spectrometry 24 (3) 91 (1995) https://doi.org/10.1002/xrs.1300240304