Articles citing this article

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Cited article:

X-ray characterization of semiconductor surfaces and interfaces

W. Plotz, V. Holy, W. V. D. Hoogenhof, K. Lischka

J. Phys. III France, 4 9 (1994) 1565-1571

DOI: https://doi.org/10.1051/jp3:1994223

This article has been cited by the following article(s):

X-ray diffuse scattering by multilayer waveguide structures

A. Andreev, Yu. Ponomarev, I. Prudnikov and N. Salashchenko
Physical Review B 57 (20) 13113 (1998)
https://doi.org/10.1103/PhysRevB.57.13113

Resonance enhancement of diffuse scattering of x-rays in a waveguide heterostructure

A. V. Andreev, Yu. V. Ponomarev, I. R. Prudnikov and N. N. Salashchenko
Journal of Experimental and Theoretical Physics Letters 66 (4) 236 (1997)
https://doi.org/10.1134/1.567460

Scattering of X-rays and neutrons at interfaces

S. Dietrich and A. Haase
Physics Reports 260 (1-2) 1 (1995)
https://doi.org/10.1016/0370-1573(95)00006-3

An investigation of X-ray reflectivity and diffraction from electroluminescent short-period Si-Ge superlattice structures

W M Plotz, E Koppensteiner, H Kibbel, et al.
Semiconductor Science and Technology 10 (12) 1614 (1995)
https://doi.org/10.1088/0268-1242/10/12/009