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Cited article:

Recent advances in etched multilayer X-ray optics

J. M. André, A. Sammar, S. Bac, M. Ouahabi, M. Idir, G. Soullié, R. Barchewitz

J. Phys. III France, 4 9 (1994) 1659-1668

DOI: https://doi.org/10.1051/jp3:1994231

This article has been cited by the following article(s):

Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements

C. Hombourger, P. Jonnard, J. -M. André and J. -P. Chauvineau
X-Ray Spectrometry 28 (3) 163 (1999)
https://doi.org/10.1002/(SICI)1097-4539(199905/06)28:3<163::AID-XRS331>3.0.CO;2-Z

Calibration and spectroscopy with a laterally-d graded multilayer interference mirror

P. Stemmler, C. Bizeuil, R. Marmoret, et al.
Journal of Electron Spectroscopy and Related Phenomena 101-103 919 (1999)
https://doi.org/10.1016/S0368-2048(98)00370-3