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Cited article:

Mesure de la conductivité complexe et de la résistance de surface de films supraconducteurs YBaCuO

F. Mehri, P. Lepercq, J. C. Carru, E. Playez, C. Thivet, A. Perrin, D. Chambonnet

J. Phys. III France, 4 11 (1994) 2259-2270

DOI: https://doi.org/10.1051/jp3:1994276

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References

This article has been cited by the following article(s):

Growth and characterization of HTSC thin films for microelectronic devices

A. Perrin, M. Guilloux-Viry, X. Castel and C. Le Paven-Thivet
Microelectronics Journal 27 (4-5) 343 (1996)
https://doi.org/10.1016/0026-2692(95)00061-5