Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Detection and Characterization of Precipitates in Annealed Cz Silicon Wafers

Caroline Veve, Nathalie Gay, Michäel Stemmer, Santo Martinuzzi

J. Phys. III France, 5 9 (1995) 1353-1363

DOI: https://doi.org/10.1051/jp3:1995195

PDF (1.037 MB)
References

This article has been cited by the following article(s):

Quantitative copper measurement in oxidized p-type silicon wafers using microwave photoconductivity decay

H. Väinölä, E. Saarnilehto, M. Yli-Koski, et al.
Applied Physics Letters 87 (3) 032109 (2005)
https://doi.org/10.1063/1.1999008