Articles citing this article

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Cited article:

An indentation method to measure the CRSS of semiconducting materials at elevated temperature

J.P. Rivière, L. Largeau, G. Patriarche and E. Le Bourhis
Materials Science and Engineering: A 400-401 451 (2005)
https://doi.org/10.1016/j.msea.2005.03.104

Material flow under an indentor in indium phosphide

E. Le Bourhis, J. P. Riviere and A. Zozime
Journal of Materials Science 31 (24) 6571 (1996)
https://doi.org/10.1007/BF00356264