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Cited article:

Extended Generation Profile - E.B.I.C. Model

S. Guermazi, A. Toureille, C. Grill, B. El Jani, N. Lakhoua

J. Phys. III France, 6 4 (1996) 481-490

DOI: https://doi.org/10.1051/jp3:1996136

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Minority carrier diffusion lengths and optical self‐absorption coefficient in undoped GaN

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Determination of the diffusion length and the optical self absorption coefficient using EBIC model

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Ageing phenomena and determination of the optical self absorption coefficient in PN junction

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Extended generation profile - E.B.I.C model application in the case of a PN junction

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