Articles citing this article

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Cited article:

Detection of traps induced and activated by high field stress in an N-channel VDMOSFET transistor using current deep level transient spectroscopy (CDLTS)

N. Abboud, Y. Cuminal, A. Foucaran and C. Salame
Microelectronic Engineering 88 (11) 3333 (2011)
https://doi.org/10.1016/j.mee.2011.08.008

 Semi-insulating  silicon using deep level impurity doping: problems and potential

Kanad Mallik, R J Falster and P R Wilshaw
Semiconductor Science and Technology 18 (6) 517 (2003)
https://doi.org/10.1088/0268-1242/18/6/321