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Cited article:

New Insights of Ferroelectric Hf0.5Zr0.5O2 Thin Films Properties Under Cryogenic Temperatures in Integrated Ferroelectric Capacitors

Flavien Berthaud, Niccolo Castellani, Nicolas Vaxelaire, Guillaume Freychet, Amanda Malmann Tonelli, Liam Hosier, Jean Rottner, Catherine Carabasse, Mikael Cassé, Laurent Grenouillet and Simon Martin
Advanced Physics Research 5 (2) (2026)
https://doi.org/10.1002/apxr.202500127

Analysis of electromechanical behaviour of (1–x)PMN–xPT (with x⩽0.1) bulk ceramics

Martine Lejeune, Edith Lattard, Sylvie Kurutcharry, et al.
Ceramics International 26 (6) 655 (2000)
https://doi.org/10.1016/S0272-8842(99)00112-1