Articles citing this article

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Cited article:

Thermal stability of defects in plastically deformed silicon studied by positron lifetime spectroscopy

Jin-Biao Pang, Hartmut S Leipner, Reinhard Krause-Rehberg, et al.
Semiconductor Science and Technology 27 (3) 035023 (2012)
https://doi.org/10.1088/0268-1242/27/3/035023

Electronic effects of Se and Pb dopants in TlBr

Holland M. Smith, David J. Phillips, Ian D. Sharp, et al.
Applied Physics Letters 100 (20) (2012)
https://doi.org/10.1063/1.4712596

PICTS analysis of extended defects in heavily irradiated silicon

D. Menichelli, E. Borchi, Zheng Li and M. Bruzzi
IEEE Transactions on Nuclear Science 49 (5) 2431 (2002)
https://doi.org/10.1109/TNS.2002.803881

Photo-induced current transient spectroscopy of defect clusters in heavily irradiated silicon

David Menichelli and Mara Bruzzi
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 485 (1-2) 146 (2002)
https://doi.org/10.1016/S0168-9002(02)00546-6

Measurements of energy spectra of extended defects

Wolfgang Schr ter, Henrik Hedemann, Vitaly Kveder and Frank Riedel
Journal of Physics: Condensed Matter 14 (48) 13047 (2002)
https://doi.org/10.1088/0953-8984/14/48/350