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Cited article:

A Generalized Minimal Residual Acceleration of the Charge Iteration Procedure

G. Aiello, S. Alfonzetti, G. Borzì

J. Phys. III France, 7 10 (1997) 1955-1966

DOI: https://doi.org/10.1051/jp3:1997234

This article has been cited by the following article(s):

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Eddy Current Computation by the FEM-SDBCI Method

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Efficient Analysis of Grounding Systems by Means of the Hybrid FEM–DBCI Method

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A comparison between hybrid methods: FEM-BEM versus FEM-DBCI

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S. Alfonzetti, S. Conti and S. A. Rizzo
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Improved Selection of the Integration Surface in the Hybrid FEM-DBCI Method

Giovanni Aiello, Salva Alfonzetti and Nunzio Salerno
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A Modified FEM-DBCI Method for Static and Quasi-Static Electromagnetic Field Problems

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A Non-Standard Family of Boundary Elements for the Hybrid FEM-BEM Method

S. Alfonzetti and N. Salerno
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Efficient Solution of Skin-Effect Problems by Means of the GMRES-Accelerated FEM-BEM Method

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Intelligent Computer Techniques in Applied Electromagnetics

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Numerical implementations of the FEM‐DBCI integral equation

S. Alfonzetti, Sławomir Wiak, G. Aiello, E. Dilettoso and N. Salerno
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 27 (4) 879 (2008)
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A GMRES iterative solution of FEM‐BEM global systems in skin effect problems

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COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 27 (6) 1286 (2008)
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Comparing FEM-BEM and FEM-DBCI for open-boundary electrostatic field problems

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The European Physical Journal Applied Physics 39 (2) 143 (2007)
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Improving the accuracy of the integral equation in the hybrid FEM-DBCI method for open boundary electrostatic problems

G. Aiello, S. Alfonzetti, E. Dilettoso and N. Salerno
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An improved solution scheme for open-boundary skin effect problems

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Field methods and computational techniques

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Stochastic optimization of an electromagnetic actuator by means of Dirichlet boundary condition iteration

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Some considerations about the perfectly matched layer for static fields

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COMPEL - The international journal for computation and mathematics in electrical and electronic engineering 18 (3) 337 (1999)
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