Articles citing this article

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Cited article:

Convergent beam electron diffraction for strain determination at the nanoscale

F. Houdellier, C. Roucau and M.-J. Casanove
Microelectronic Engineering 84 (3) 464 (2007)
https://doi.org/10.1016/j.mee.2006.10.063

Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction

W. C. Sun, H. C. Chang, B. K. Wu, et al.
Applied Physics Letters 89 (9) 091915 (2006)
https://doi.org/10.1063/1.2345023

Quantitative analysis of HOLZ line splitting in CBED patterns of epitaxially strained layers

F. Houdellier, C. Roucau, L. Clément, J.L. Rouvière and M.J. Casanove
Ultramicroscopy 106 (10) 951 (2006)
https://doi.org/10.1016/j.ultramic.2006.04.011

Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns

Feng Wu, Aldo Armigliato, Roberto Balboni and Stefano Frabboni
Ultramicroscopy 80 (3) 193 (1999)
https://doi.org/10.1016/S0304-3991(99)00112-6