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Growth and characterization of HTSC thin films for microelectronic devices

A. Perrin, M. Guilloux-Viry, X. Castel and C. Le Paven-Thivet
Microelectronics Journal 27 (4-5) 343 (1996)
DOI: 10.1016/0026-2692(95)00061-5
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Growth defects and interface roughness in YBa2Cu3O7/SrTiO3 superlattices grown by pulsed laser ablation

J. Ayache, J.P Contour, C. Dolin, M. Drouet and D. Ravelosona
Journal of Alloys and Compounds 251 (1-2) 185 (1997)
DOI: 10.1016/S0925-8388(96)02795-8
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