Radiation Effects in Thin-Film Ferroelectric PZT for Non-Volatile Memory Applications in Microelectronics Jean-Luc Leray, Olivier Musseau, Philippe Paillet, Jean-Luc Autran, Frédéric Sodi and Yves-Marie Coïc J. Phys. III France, 7 6 (1997) 1227-1243 DOI: 10.1051/jp3:1997185