Journal de Physique III

Strain Measurements in Thin Film Structures by Convergent Beam Electron Diffraction

A. Armigliato, R. Balboni, A. Benedetti, S. Frabboni, A. Tixier and J. Vanhellemont

J. Phys. III France, 7 12 (1997) 2375-2381

DOI: 10.1051/jp3:1997265

A. Armigliato

R. Balboni

A. Benedetti

S. Frabboni

A. Tixier

J. Vanhellemont

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