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Article cité :
K. F. Badawi , C. Kahloun , J. Grilhé
J. Phys. III France, 3 6 (1993) 1183-1188
Citations de cet article :
13 articles
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Profile analysis of thin film X-ray diffraction peaks
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Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation
N. Durand, K. F. Badawi and Ph. Goudeau Journal of Applied Physics 80 (9) 5021 (1996) https://doi.org/10.1063/1.363547
Small Scale Structures
Ph. Goudeau, B. Boubeker, J.P. Eymery and V. Branger Small Scale Structures 188 (1996) https://doi.org/10.1016/B978-0-444-82312-0.50097-9
Residual stresses influence on the structural evolution of CuMo solid solutions studied by X-ray diffraction
Ph. Goudeau, J. Mimault, Th. Girardeau, et al. Thin Solid Films 275 (1-2) 25 (1996) https://doi.org/10.1016/0040-6090(95)07012-5
Small Scale Structures
L. Bimbault, K.F. Badawi, PH. Goudeau, V. Branger and N. Durand Small Scale Structures 40 (1996) https://doi.org/10.1016/B978-0-444-82312-0.50061-X
Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction
N. Durand, K.F. Badawi and Ph. Goudeau Thin Solid Films 275 (1-2) 168 (1996) https://doi.org/10.1016/0040-6090(96)80096-4
Rotational dynamics of water molecules in a water–short-chain-nonionic-amphiphile mixture: Depolarized light scattering
Norberto Micali, Sebastiano Trusso, Cirino Vasi, et al. Physical Review E 51 (3) 2349 (1995) https://doi.org/10.1103/PhysRevE.51.2349
X‐ray study of elastic and plastic strains in Na+‐implanted (001) monocrystalline MgO
R. Brenier, M. Beranger, B. Canut, et al. Journal of Applied Physics 77 (10) 5004 (1995) https://doi.org/10.1063/1.359309