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Phase transformation of the A15 metastable phase of Fe-Cr thin films prepared by ion-beam sputtering

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Journal of Applied Physics 102 (4) (2007)
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Characterization and modeling of electrical resistivity of sputtered tungsten films

J. Ligot, S. Benayoun and J. J. Hantzpergue
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (3) 798 (2001)
https://doi.org/10.1116/1.1355759

Stress and microstructure in YBaCuO thin films on MgO and SrTiO3 substrates studied by X-ray diffraction and bending tests

S. Auzary, F. Badawi, L. Bimbault, J. Rabier and R.J. Gaboriaud
Journal of Alloys and Compounds 251 (1-2) 37 (1997)
https://doi.org/10.1016/S0925-8388(96)02767-3

Residual stresses and microstructure in tungsten thin films analyzed by x-ray diffraction-evolution under ion irradiation

N. Durand, K. F. Badawi and Ph. Goudeau
Journal of Applied Physics 80 (9) 5021 (1996)
https://doi.org/10.1063/1.363547

Influence of microstructure on residual stress in tungsten thin films analyzed by X-ray diffraction

N. Durand, K.F. Badawi and Ph. Goudeau
Thin Solid Films 275 (1-2) 168 (1996)
https://doi.org/10.1016/0040-6090(96)80096-4

Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses

D. Rats, L. Bimbault, L. Vandenbulcke, R. Herbin and K. F. Badawi
Journal of Applied Physics 78 (8) 4994 (1995)
https://doi.org/10.1063/1.359725