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On the Frequency-Dependence of the Chirality Pseudoscalar of a Chiral Medium

Frédéric Guérin, Akhlesh Lakhtakia

J. Phys. III France, 5 7 (1995) 913-918

DOI: https://doi.org/10.1051/jp3:1995170

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Single shot excimer laser crystallization of silicon films deposited by LPCVD

K. Kis-Sion, T. Mohammed-Brahim, D. Briand, et al.
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Transmission ellipsometry of a thin-film helicoidal bianisotropic medium

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Experimental Verifaction of Physical Conditions Restricting Chiral Material Parameters

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