Issue
J. Phys. III France
Volume 4, Number 9, September 1994
Page(s) 1679 - 1686
DOI https://doi.org/10.1051/jp3:1994233
DOI: 10.1051/jp3:1994233
J. Phys. III France 4 (1994) 1679-1686

The HELIOS series of advanced, synchrotron based, X-ray sources

V. C. Kempson, A. R. Jorden, N. C. E. Crosland, M. N. Wilson, J. C. Schouten, M. C. Townsend and R. J. Anderson

Oxford Instruments, Accelerator Technology Group, Osney Mead, Oxford OX2 ODX, Great Britain

(Received 19 November 1993, accepted 28 January 1994)

Abstract
The compact synchrotron X-ray source, HELIOS built by Oxford Instruments, was commissioned at IBM's Advanced Lithography Facility at Fishkill New York in 1991. Key features and specifications for HELIOS are described, emphasising the unique features of this storage ring X-ray source. The performance of the first machine is outlined, based on almost two years' routine operation, identifying key factors such as output flux, beam lifetime and reliability. A description of the second HELIOS and enhancements to its performance is included.



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