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Cited article:

Possiblités de mesure quantitative avec un appareillage de réflectométrie X utilisant le mode angulaire dispersif

J. Chihab, A. Naudon

J. Phys. III France, 2 12 (1992) 2291-2300

DOI: https://doi.org/10.1051/jp3:1992246

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