Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Détermination des épaisseurs de films très minces de SiO₂ sur silicium par microscopie électronique en transmission, ellipsométrie spectroscopique et spectroscopie de photoélectrons

R. Saoudi, G. Hollinger, A. Gagnaire, P. Ferret, M. Pitaval

J. Phys. III France, 3 7 (1993) 1479-1488

DOI: https://doi.org/10.1051/jp3:1993212

This article has been cited by the following article(s):

Increasing Detectivity of Polarization Modulation Infrared Reflection—Absorption Spectroscopy for the Study of Ultrathin Films Deposited on Various Substrates

J. Saccani, T. Buffeteau, B. Desbat and D. Blaudez
Applied Spectroscopy 57 (10) 1260 (2003)
https://doi.org/10.1366/000370203769699135

Sub-0.1 μm gate etch processes: Towards some limitations of the plasma technology?

L. Desvoivres, L. Vallier and O. Joubert
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 18 (1) 156 (2000)
https://doi.org/10.1116/1.591168

Electronic structure of a heterostructure of an alkylsiloxane self-assembled monolayer on silicon

D. Vuillaume, C. Boulas, J. Collet, G. Allan, and C. Delerue
Physical Review B 58 (24) 16491 (1998)
https://doi.org/10.1103/PhysRevB.58.16491

Analyses of the chemical topography of silicon dioxide contact holes etched in a high density plasma source

O. Joubert, P. Czuprynski, F. H. Bell, P. Berruyer and R. Blanc
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 15 (3) 629 (1997)
https://doi.org/10.1116/1.589305

Suppression of Charge Carrier Tunneling through Organic Self-Assembled Monolayers

C. Boulas, J. V. Davidovits, F. Rondelez and D. Vuillaume
Physical Review Letters 76 (25) 4797 (1996)
https://doi.org/10.1103/PhysRevLett.76.4797