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Cited article:

Influence of roughness profile on reflectivity and angle-dependent X-ray fluorescence

D.K.G. de Boer, A.J.G. Leenaers, W.W. van den Hoogenhof

J. Phys. III France, 4 9 (1994) 1559-1564

DOI: https://doi.org/10.1051/jp3:1994222

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