Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Characterization of thin films and multilayers by specular X-ray reflectivity

W. M. Plotz, K. Lischka

J. Phys. III France, 4 9 (1994) 1503-1511

DOI: https://doi.org/10.1051/jp3:1994303

This article has been cited by the following article(s):

L.K. Yik, C.L. Lee and D. Weissbach
1 (2010)
https://doi.org/10.1109/ICP.2010.5604398

Genetic algorithm for solution of the inverse problem in high-resolution X-ray reflectometry

A. G. Sutyrin and D. Yu. Prokhorov
Crystallography Reports 51 (4) 570 (2006)
https://doi.org/10.1134/S1063774506040055

Structural characterization of interfaces in the AlxGa1−x As/GaAs/AlxGa1−x As heterostructures by high-resolution X-ray reflectometry and diffractometry

A. A. Lomov, A. G. Sutyrin, D. Yu. Prokhorov, et al.
Crystallography Reports 50 (5) 739 (2005)
https://doi.org/10.1134/1.2049390

Scattering of X-rays and neutrons at interfaces

S. Dietrich and A. Haase
Physics Reports 260 (1-2) 1 (1995)
https://doi.org/10.1016/0370-1573(95)00006-3

An investigation of X-ray reflectivity and diffraction from electroluminescent short-period Si-Ge superlattice structures

W M Plotz, E Koppensteiner, H Kibbel, et al.
Semiconductor Science and Technology 10 (12) 1614 (1995)
https://doi.org/10.1088/0268-1242/10/12/009

D K G De Boer, A J G Leenaers and R M Wolf
Journal of Physics D: Applied Physics 28 (4A) A227 (1995)
https://doi.org/10.1088/0022-3727/28/4A/044