J. Phys. III France
Volume 4, Numéro 8, August 1994
Page(s) 1481 - 1493
DOI: 10.1051/jp3:1994215
J. Phys. III France 4 (1994) 1481-1493

General analysis of inductive sensor based systems for non destructive testing

Isabelle Dufour1, Moolraj Busawon1, Denis Premel 2 and Dominique Placko1

1  Laboratoire d'Electricité, Signaux et Robotique (LESIR), URA CNRS D 1375, Ecole Normale Supérieure de Cachan, 61 avenue du Président Wilson, 94235 Cachan Cedex, France
2  Laboratoire des Signaux et Système (LSS), CNRS-ESE-UPS, Ecole Supérieure d'Electricité, Plateau du Moulon, 91192 Gif-sur-Yvette Cedex, France

(Received 20 January 1994, accepted 20 May 1994)

This paper presents a general view of the Non Destructive Testing (NDT) systems based on the use of inductive sensors where the potential users are likely to be more and more numerous. We describe the different phases of their conception. Firstly, we analyse the physical interaction between the sensor and the specimen material by the use of an enlarged concept of electrical images. The instrumentation problem is next reviewed by analysing the signals which are supplied by these sensors, and by the way leading to the definition of the differing range of applications of such sensors. Finally, we enumerate the various signal processing techniques usually applied in NDT and based on the general inversion techniques.

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