Issue
J. Phys. III France
Volume 4, Number 5, May 1994
Page(s) 859 - 865
DOI https://doi.org/10.1051/jp3:1994170
DOI: 10.1051/jp3:1994170
J. Phys. III France 4 (1994) 859-865

Structural and magnetic properties of Fe films grown on GaAS

M. Rahmoune and J. P. Eymery

Laboratoire de Métallurgie Physique, URA 131 CNRS, Université de Poitiers, 40 avenue du Recteur Pineau, 86022 Poitiers, France

(Received 30 November 1993, revised 7 February 1994, accepted 22 February 1994)

Abstract
A study is presented of magnetic and structural properties of thin Fe films deposited on (111) GaAs substrates for thicknesses ranging from 65 to 120 nm. The films grown by ion-beam-sputtering exhibit both bcc phase and ferromagnetic structure. Transmission electron microscopy has allowed to determine the morphological growth stages and the grain size of the films. Both vibrating sample magnetometry and Mössbauer effect measurements show that the magnetic moments are lying in the film plane for every film. The average magnetization and 57Fe hyperfine field decrease with decreasing thickness which indicates the existence of two iron sites. An in-plane uniaxial anisotropy is found for the 65 nm thick film. Finally at film thickness approaching 120 nm, the film assumes the character of bulk $\alpha$-Fe.



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