Trap and Dislocation Electrical Activity in a Reversely Biased P-N Junction in Silicon p. 1307 Bernard Leroy DOI: https://doi.org/10.1051/jp3:1995192 AbstractPDF (1.062 MB)References
Electrical Properties of Dislocations in Plastically Deformed Float Zone Silicon p. 1327 J.J. Simon, E. Yakimov and M. Pasquinelli DOI: https://doi.org/10.1051/jp3:1995193 AbstractPDF (593.3 KB)References
Aluminium Gettering in Silicon Wafers p. 1337 S. Martinuzzi, O. Porre, I. Périchaud and M. Pasquinelli DOI: https://doi.org/10.1051/jp3:1995100 AbstractPDF (312.1 KB)References
Classical and Rapid Thermal Process Effects on Oxygen Precipitation in Silicon p. 1345 K. Mahfoud, M. Loghmarti, J.C. Muller and P. Siffert DOI: https://doi.org/10.1051/jp3:1995194 AbstractPDF (616.3 KB)References
Detection and Characterization of Precipitates in Annealed Cz Silicon Wafers p. 1353 Caroline Veve, Nathalie Gay, Michäel Stemmer and Santo Martinuzzi DOI: https://doi.org/10.1051/jp3:1995195 AbstractPDF (1.037 MB)References
Post-Diffusion Gettering Effects Induced in Polycrystalline Silicon p. 1365 M. Loghmarti, K. Mahfoud, L. Ventura, J.C. Muller, D. Sayah and P. Siffert DOI: https://doi.org/10.1051/jp3:1995196 AbstractPDF (354.6 KB)References
A Comparative Study of the EBIC Contrast and Gettering Efficiency of the Tilt Boundaries $\Sigma = 25$, $\Sigma = 13$ and $\Sigma = 9$ in Silicon Bicrystals p. 1371 A. Ihlal, R. Rizk, P. Voivenel and G. Nouet DOI: https://doi.org/10.1051/jp3:1995197 AbstractPDF (818.6 KB)References
Properties of Dislocations in HgCdTe Crystals p. 1383 P.O. Renault, J.F. Barbot, P. Girault, A. Declemy, G. Rivaud and C. Blanchard DOI: https://doi.org/10.1051/jp3:1995198 AbstractPDF (400.7 KB)References
Correlated Chemical and Positional Fluctuations in the Gold-Nickel System: a Synchrotron X-Ray Diffuse Scattering Study p. 1391 G. Renaud, M. Belakhovsky, S. Lefebvre and M. Bessière DOI: https://doi.org/10.1051/jp3:1995199 AbstractPDF (1012 KB)References
Surface Potential Control on Thin Oxide Films with Respect to Electron Stimulated Desorption Studies p. 1407 Marc Bernheim and Gilles Rousse DOI: https://doi.org/10.1051/jp3:1995200 AbstractPDF (1.035 MB)References
Ondes de surface transverses sur plaques piézoélectriques avec réseaux de bandes metalliques déposés sur les 2 faces p. 1425 S. Ballandras, E. Gavignet and E. Bigler DOI: https://doi.org/10.1051/jp3:1995201 AbstractPDF (614.1 KB)References
Diffusion du champ électromagnétique dans une sphère ferromagnétique conductrice avec hystérésis p. 1437 M. Saadi, F. Jellali and G. Quichaud DOI: https://doi.org/10.1051/jp3:1995202 AbstractPDF (763.1 KB)References
Laser Beam Lithography for Direct Patterning of Interconnections on Prediffused ASIC's p. 1455 A. Fleury, E. Saint-Christophe, H. Frémont, M. Fathi, G. N'Kaoua and Y. Danto DOI: https://doi.org/10.1051/jp3:1995203 AbstractPDF (636.0 KB)References
The Linear Motor in the Human Neutrophil Migration p. 1469 V. Vereycken, H. Gruler, C. Bucherer, C. Lacombe and J.C. Lelièvre DOI: https://doi.org/10.1051/jp3:1995204 AbstractPDF (818.5 KB)References
